University and KLA PhD: Metrology and Process Integration for Defect Mapping of Next Generation Semiconductor Materials... applications. KLA's systems, encompassing design-manufacturability verification, new process characterization, and manufacturing...
Swansea UniversityIntegration for Defect Mapping of Next Generation Semiconductor Materials and Devices This PhD project will harness the power... premier metrology company specializing in chip and substrate manufacturing applications. KLA's systems, encompassing design...